High Frequency Scattering Analysis of Dielectric Surfaces TM Incidence Case

被引：0

作者：

Ngoc, An Nguyen ^{[1
]}

Shirai, Hiroshi ^{[1
]}

机构：

[1] Chuo Univ, Grad Sch Sci & Engn, Bunkyo Ku, Tokyo 1128551, Japan

来源：

2013 ASIA-PACIFIC MICROWAVE CONFERENCE PROCEEDINGS (APMC 2013) | 2013年

关键词：

RCS; equivalent currents; Kirchhoff approximation; dielectric bodies; multiple reflection;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Electromagnetic TM polarized plane wave scattering by dielectric surfaces is analyzed by high frequency asymptotic method. The scattering field is estimated from the equivalent currents induced by reflected plane wave on the dielectric surface. Effects of material nature, polarization and finiteness of the dielectric bodies are included in a multiple reflection coefficient. A comparison between theoretical estimations and measurement in the case of a rubber cube suggests a strong connection between the thickness of the body and its RCS values.

引用

页码：294 / 296

页数：3

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