Noise-Induced Spectral Narrowing in a Micro-Electromechanical Resonator

被引：0

作者：

Soskin, Stanislav ^{[1
]}

Chan, Ho Bun ^{[2
]}

Ninios, Konstantinos ^{[3
]}

Mannella, Riccardo ^{[4
]}

机构：

[1] Inst Semicond Phys, Dept Theoret Phys, Kiev, Ukraine

[2] Hong Kong Univ Sci & Technol, Dept Phys, Hong Kong, Hong Kong, Peoples R China

[3] Univ Florida, Dept Phys, Gainesville, FL 32611 USA

[4] Univ Pisa, Dipartimento Fis, I-56100 Pisa, Italy

来源：

2013 22ND INTERNATIONAL CONFERENCE ON NOISE AND FLUCTUATIONS (ICNF) | 2013年

关键词：

micro-electromechanical; noise; spectrum; ZERO-DISPERSION PEAKS; FLUCTUATION SPECTRUM; SYSTEMS;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A counter-intuitive phenomenon of the noise-induced narrowing of a main peak in the fluctuation spectrum is predicted to occur in a micro-electromechanical resonator. This phenomenon occurs because the frequency of eigenoscillations of the resonator possesses a local maximum as a function of its energy. Analogous maxima/minima are characteristic for the broad class of zero-dispersion (ZD) systems. Like other ZD systems, the resonator may manifest a bulk of characteristic phenomena that could have a large potential for applications.

引用

页数：4

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