Functionalized benzothieno[3,2 b]thiophenes (BTTs) for high performance organic thin-film transistors (OTFTs)

被引:17
作者
Youn, Jangdae [1 ,2 ]
Huang, Peng-Yi [3 ]
Zhang, Shiming [1 ,2 ]
Liu, Chiao-Wei [3 ]
Vegiraju, Sureshraju [3 ]
Prabakaran, Kumaresan [3 ]
Stern, Charlotte [1 ,2 ]
Kim, Choongik [4 ]
Chen, Ming-Chou [3 ]
Facchetti, Antonio [1 ,2 ]
Marks, Tobin J. [1 ,2 ]
机构
[1] Northwestern Univ, Dept Chem, Evanston, IL 60208 USA
[2] Northwestern Univ, Mat Res Ctr, Evanston, IL 60208 USA
[3] Natl Cent Univ, Dept Chem, Chungli 32054, Taiwan
[4] Sogang Univ, Dept Chem & Biomol Engn, Seoul 121742, South Korea
基金
新加坡国家研究基金会;
关键词
FIELD-EFFECT TRANSISTORS; LARGE-AREA; SUBSTITUTED PENTACENE; SEMICONDUCTORS; MOBILITY; POLYMER; SURFACE; DERIVATIVES; STABILITY; LIGHT;
D O I
10.1039/c4tc01115e
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
New benzothieno[3,2-b]thiophene (BTT) derivatives, end-functionalized with biphenyl (Bp-BTT), naphthalenyl (Np-BTT), and benzothieno[3,2-b] thiophenyl (BBTT; dimer of BTT) moieties, were synthesized and characterized for bottom-gate/top-contact organic thin-film transistors (OTFTs). All three materials exhibit good environmental stability as assessed by thermogravimetric analysis, and no decomposition after extended light exposure, due to their wide band gaps and low-lying HOMOs. The single crystal structures of Bp-BTT and BBTT reveal flat molecular geometries, close pi-pi stacking, and short sulfur-to-sulfur distances, suggesting an ideal arrangement for charge transport. X-ray diffraction (XRD) measurements verify that the bulk crystal structures are preserved in the polycrystalline thin films. As a consequence, Bp-BTT and BBTT exhibit good OTFT performance, with mu = 0.34 cm(2) V-1 s(-1) (max) and I-on/I-off (3.3 +/- 1.6) x 10(8) for Bp-BTT, and mu = 0.12 cm(2) V-1 s(-1)(max) and I-on/I-off (2.4 +/- 0.9) x 10(7) for BBTT; whereas Np-BTT gives lower device performance with mu = 0.055 cm(2) V-1 s(-1) (max) and I-on/I-off (6.7 +/- 3.4) x 10(8). In addition, octadecyltrichlorosilane (OTS) self-assembled monolayer (SAM) treatment of the SiO2 gate dielectric is found to be effective in enhancing the OTFT performance for all three BTT derivatives, by improving the interfacial semiconductor film morphology and in-plane crystallinity.
引用
收藏
页码:7599 / 7607
页数:9
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