Point-contact spectroscopy in MgB2:: from fundamental physics to thin-film characterization

被引：14

作者：

Gonnelli, RS ^{[1
]}

Daghero, D

Calzolari, A

Ummarino, GA

Dellarocca, V

Stepanov, VA

Kazakov, SM

Karpinski, J

Portesi, C

Monticone, E

Ferrando, V

Ferdeghini, C

机构：

[1] Politecn Torino, INFM, Dipartimento Fis, I-10129 Turin, Italy

[2] Russian Acad Sci, PN Lebedev Phys Inst, Moscow 119991, Russia

[3] ETH, Solid State Phys Lab, CH-8093 Zurich, Switzerland

[4] Ist Elettrotecnico Nazl Galileo Ferraris, I-10135 Turin, Italy

[5] Univ Genoa, Dipartimento Fis, INFM, LAMIA, I-16146 Genoa, Italy

来源：

SUPERCONDUCTOR SCIENCE & TECHNOLOGY | 2004年 / 17卷 / 05期

关键词：

D O I：

10.1088/0953-2048/17/5/001

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In this paper we highlight the advantages of using point-contact spectroscopy (PCS) in multigap superconductors like MgB2, both as a fundamental research too] and as a non-destructive diagnostic technique for the optimization of thin-film characteristics. We first present some results of crucial fundamental interest obtained by directional PCS in MgB2 single crystals, for example the temperature dependence of the gaps and of the critical fields, and the effect of a magnetic field on the gap amplitudes. Then, we show how PCS can provide useful information about the surface properties of MgB2 thin films (e.g., T-c gap amplitude(s), clean- or dirty-limit conditions) in view of their optimization for the fabrication of tunnel and Josephson junctions for applications in superconducting electronics.

引用

页码：S93 / S100

页数：8

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