Finite element simulation of inhomogeneous solar cells based on lock-in thermography and luminescence imaging

被引：20

作者：

Fruehauf, F. ^{[1
]}

Wong, J. ^{[2
]}

Bauer, J. ^{[1
]}

Breitenstein, O. ^{[1
]}

机构：

[1] Max Planck Inst Microstruct Phys, Halle, Germany

[2] Solar Energy Res Inst Singapore, Singapore, Singapore

来源：

SOLAR ENERGY MATERIALS AND SOLAR CELLS | 2017年 / 162卷

关键词：

Lock-in thermography; Electroluminescence imaging; Photoluminescence imaging; Device simulation; Contact resistance imaging; SERIES RESISTANCE; EFFICIENCY ANALYSIS; DIFFUSION LENGTH; PHOTOLUMINESCENCE;

D O I：

10.1016/j.solmat.2016.12.037

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

This work presents a method to extract the spatial distributions of local two-diode parameters, contact resistance, grid resistance, and emitter resistance of a solar cell, based on spatial data obtained by lock-in thermography, 4-point probing, electroluminescence, and photoluminescence imaging. The extracted parameters are input into Griddler, a finite-element simulator, to calculate the cell plane voltage distributions as a test of the goodness of fit. This Griddler model then can be used to predict the cell properties under conditions not measured before, e.g. at different temperatures, biasing, and illumination conditions, and it can be used to evaluate the influence of certain defects on the cell efficiency by excluding them in the simulation.

引用

页码：103 / 113

页数：11

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