Finite element simulation of inhomogeneous solar cells based on lock-in thermography and luminescence imaging

被引：21
作者：
Fruehauf, F. [1 ]
Wong, J. [2 ]
Bauer, J. [1 ]
Breitenstein, O. [1 ]
机构：
[1] Max Planck Inst Microstruct Phys, Halle, Germany
[2] Solar Energy Res Inst Singapore, Singapore, Singapore
来源：
SOLAR ENERGY MATERIALS AND SOLAR CELLS | 2017年 / 162卷
关键词：
Lock-in thermography; Electroluminescence imaging; Photoluminescence imaging; Device simulation; Contact resistance imaging; SERIES RESISTANCE; EFFICIENCY ANALYSIS; DIFFUSION LENGTH; PHOTOLUMINESCENCE;
D O I：
10.1016/j.solmat.2016.12.037
中图分类号：
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号：
0807 ; 0820 ;
摘要：
This work presents a method to extract the spatial distributions of local two-diode parameters, contact resistance, grid resistance, and emitter resistance of a solar cell, based on spatial data obtained by lock-in thermography, 4-point probing, electroluminescence, and photoluminescence imaging. The extracted parameters are input into Griddler, a finite-element simulator, to calculate the cell plane voltage distributions as a test of the goodness of fit. This Griddler model then can be used to predict the cell properties under conditions not measured before, e.g. at different temperatures, biasing, and illumination conditions, and it can be used to evaluate the influence of certain defects on the cell efficiency by excluding them in the simulation.
引用
收藏
页码：103 / 113
页数：11
相关论文
共 27 条
[1]  
[Anonymous], P 40 IEEE PVSC TAMP
[2]  
Bothe K., 2013, ADV PHOTOVOLTAICS, V2
[3]  
Breitenstein O, 2010, SPR SER ADV MICROELE, V10, P1, DOI 10.1007/978-3-642-02417-7
[4]   Improved empirical method for calculating short circuit current density images of silicon solar cells from saturation current density images and vice versa [J].
Breitenstein, O. ;
Fruehauf, F. ;
Turek, M. .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2016, 154 :99-103
[5]  
Breitenstein O., 2013, 28th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC 2013). Proceedings, P1538
[6]   Local solar cell efficiency analysis performed by injection-dependent PL imaging (ELBA) and voltage-dependent lock-in thermography (Local I-V) [J].
Breitenstein, Otwin ;
Fruehauf, Felix ;
Bauer, Jan ;
Schindler, Florian ;
Michl, Bernhard .
PROCEEDINGS OF THE 6TH INTERNATIONAL CONFERENCE ON CRYSTALLINE SILICON PHOTOVOLTAICS (SILICONPV 2016), 2016, 92 :10-15
[7]   Effective Diffusion Length and Bulk Saturation Current Density Imaging in Solar Cells by Spectrally Filtered Luminescence Imaging [J].
Breitenstein, Otwin ;
Fruehauf, Felix ;
Hinken, David ;
Bothe, Karsten .
IEEE JOURNAL OF PHOTOVOLTAICS, 2016, 6 (05) :1243-1254
[8]   An Improved Method to Measure the Point Spread Function of Cameras Used for Electro- and Photoluminescence Imaging of Silicon Solar Cells [J].
Breitenstein, Otwin ;
Fruehauf, Felix ;
Teal, Anthony .
IEEE JOURNAL OF PHOTOVOLTAICS, 2016, 6 (02) :522-527
[9]   Towards an improved Laplacian-based photoluminescence image evaluation method [J].
Breitenstein, Otwin ;
Bauer, Jan ;
Hinken, David ;
Bothe, Karsten .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2015, 142 :92-101
[10]   The reliability of thermography- and luminescence-based series resistance and saturation current density imaging [J].
Breitenstein, Otwin ;
Bauer, Jan ;
Hinken, David ;
Bothe, Karsten .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2015, 137 :50-60
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