Characterization of nanometric quantum wells in semiconductor heterostructures by optical spectroscopy

被引:7
作者
Laureto, E
Vasconcellos, AR
Meneses, EA
Luzzi, R [1 ]
机构
[1] UNICAMP, Inst Fis Gleb Wataghin, BR-10083970 Campinas, SP, Brazil
[2] Univ Estadual Londrina, Ctr Ciencias Exatas, Dept Fis, BR-86151990 Londrina, Parana, Brazil
来源
INTERNATIONAL JOURNAL OF MODERN PHYSICS B | 2004年 / 18卷 / 12期
基金
巴西圣保罗研究基金会;
关键词
quantum wells; photoluminescence; fractality in growth; quality characterization; unconventional statistical approach;
D O I
10.1142/S021797920402480X
中图分类号
O59 [应用物理学];
学科分类号
摘要
Quantum wells with fractal-like interfaces arise in the growth of semiconductor heterostructures. Such fractal characteristics largely influence the optical and transport properties in these constrained geometries. We report a systematic study of growth through the study of optical properties. The spectra obtained show "anomalous behavior", whose characteristics depends on the growth procedure. The theoretical analysis was performed resorting to an unconventional statistical-mechanical formalism. It allows one to correlate growth conditions with surface roughness, and to determine their influence on experimental results, allowing one to obtain a picture of the physics involved in such systems.
引用
收藏
页码:1743 / 1758
页数:16
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