Photoluminescence Studies on Off-Stoichiometric Defects in Sprayed CZTS Thin Films

被引：0

作者：

Poornima, N. ^{[1
]}

Rajeshmon, V. G. ^{[2
]}

Kartha, C. Sudha ^{[1
]}

Vijayakumar, K. P. ^{[1
]}

机构：

[1] Cochin Univ Sci & Technol, Dept Phys, Cochin 682022, Kerala, India

[2] St Pauls Coll, Cochin 682022, Kerala, India

来源：

SOLID STATE PHYSICS: PROCEEDINGS OF THE 58TH DAE SOLID STATE PHYSICS SYMPOSIUM 2013, PTS A & B | 2014年 / 1591卷

关键词：

Photoluminescence; CZTS; defects;

D O I：

10.1063/1.4872693

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Photoluminescence (PL) technique was used for studying the defects in Copper Zinc Tin Sulphide (CZTS) thin films deposited by Chemical Spray Pyrolysis (CSP). Measurements were done on films prepared for different Cu:Zn:Sn:S ratios. An emission at 0.805 eV was monitored from 15 K to room temperature and activation energy was calculated. Excitation power dependent studies were done to analyze the type of transition.

引用

页码：614 / 616

页数：3

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