A Joint Diagnostic Test Generation Procedure with Dynamic Test Compaction

被引：8

作者：

Amyeen, M. Enamul ^{[1
]}

Pomeranz, Irith ^{[2
]}

Venkataraman, Srikanth ^{[1
]}

机构：

[1] Intel Corp, Hillsboro, OR 97124 USA

[2] Purdue Univ, Sch ECE, W Lafayette, IN 47907 USA

来源：

2016 IEEE 25TH ASIAN TEST SYMPOSIUM (ATS) | 2016年

关键词：

D O I：

10.1109/ATS.2016.15

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

A complete industrial defect diagnosis flow for yield learning includes the use of diagnostic tests. Diagnostic tests improve the ability of a defect diagnosis procedure to provide accurate diagnosis results. Because of the costs involved, diagnostic test generation is carried out only for units where the results of defect diagnosis based on a fault detection test set are not accurate enough. This paper formulates the diagnostic test generation problem under this scenario with the goal of simplifying the test application process for diagnostic tests, taking into consideration that different units require different diagnostic tests. The parameters that the problem formulation targets are the numbers of diagnostic tests for the individual units, and the total number of diagnostic tests for all the units. A lower total number of diagnostic tests increases the similarity between the diagnostic test sets for the individual units. With similar diagnostic test sets, the units are partitioned into groups such that all the units in a group are tested using the same diagnostic test set. The paper describes a diagnostic test generation procedure that uses dynamic test compaction to optimize these parameters.

引用

页码：138 / 143

页数：6

共 19 条

[1]

Abramovici M., 1995, DIGITAL SYSTEMS TEST

[2] A novel test generation methodology for adaptive diagnosis [J].

Adapa, Rajsekhar ;

Flanigan, Edward ;

Tragoudas, Spyros .

ISQED 2008: PROCEEDINGS OF THE NINTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, 2008, :242-245

[3]

CAMURATI P, 1990, PROCEEDINGS : INTERNATIONAL TEST CONFERENCE 1990, P52, DOI 10.1109/TEST.1990.114000

[4] Diagnostic test-pattern generation targeting open-segment defects and its diagnosis flow [J].

Chen, Y. -H. ;

Chang, C. -L. ;

Wen, C. H. -P. .

IET COMPUTERS AND DIGITAL TECHNIQUES, 2012, 6 (03) :186-193

[5]

CORNO F, 1995, EUR CONF DESIG AUTOM, P267, DOI 10.1109/EDTC.1995.470385

[6] Improving Fault Isolatioin using Iterative Diagnosis [J].

Gearhardt, Kevin ;

Schuermyer, Chris ;

Guo, Ruifeng .

ISTFA 2008: CONFERENCE PROCEEDINGS FROM THE 34TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2008, :390-+

[7]

Goel P., 1979, 1979 Test Conference. LSI & Boards, P189

[8]

Gruning T., 1991, 1991 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers (91CH3026-2), P194, DOI 10.1109/ICCAD.1991.185229

[9]

Guo RF, 2010, 2010 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN AUTOMATION AND TEST (VLSI-DAT), P224, DOI 10.1109/VDAT.2010.5496730

[10]

Higami Y., 2009, Proc. International Test Conf, P1

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