Improved local efficiency imaging via photoluminescence for silicon solar cells

被引：24
作者：
Shen, Chao [1 ]
Green, Martin A. [1 ]
Breitenstein, Otwin [2 ]
Trupke, Thorsten [1 ]
Zhang, Muye [1 ]
Kampwerth, Henner [1 ]
机构：
[1] Univ New S Wales, Sydney, NSW 2036, Australia
[2] Max Planck Inst Microstruct Phys, D-06120 Halle, Germany
来源：
SOLAR ENERGY MATERIALS AND SOLAR CELLS | 2014年 / 123卷
关键词：
Efficiency; Imaging; Photoluminescence; Solar cell; Spatially resolved; Silicon;
D O I：
10.1016/j.solmat.2014.01.003
中图分类号：
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号：
0807 ; 0820 ;
摘要：
We present an improved method that uses photoluminescence images to calculate the spatially-resolved efficiency in addition to other performance parameters of silicon solar cells. This new method is simpler than our previously-presented two-diode method, using only one diode with a variable ideality factor. Experimental results show that the simplified method is more tolerant of very large variations in local series resistance, a characteristic commonly seen in silicon cells. Using dark lock-in thermography techniques, we quantitatively verify the efficiency images produced by our improved method. Crown Copyright (C) 2014 Published by Elsevier B.V. All rights reserved.
引用
收藏
页码：41 / 46
页数：6
相关论文
共 17 条
[1]   THE EFFECT OF DISTRIBUTED SERIES RESISTANCE ON THE DARK AND ILLUMINATED CURRENT VOLTAGE CHARACTERISTICS OF SOLAR-CELLS [J].
ARAUJO, GL ;
CUEVAS, A ;
RUIZ, JM .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1986, 33 (03) :391-401
[2]   A two-diode model regarding the distributed series resistance [J].
Breitenstein, O. ;
Rissland, S. .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2013, 110 :77-86
[3]  
Breitenstein O., 2013, 3 INT C CRYST SIL PO
[4]   Local efficiency analysis of solar cells based on lock-in thermography [J].
Breitenstein, Otwin .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2012, 107 :381-389
[5]  
Carstensen J., 2007, P 22 EUR PHOT SOL EN
[6]   Photographic surveying of minority carrier diffusion length in polycrystalline silicon solar cells by electroluminescence [J].
Fuyuki, T ;
Kondo, H ;
Yamazaki, T ;
Takahashi, Y ;
Uraoka, Y .
APPLIED PHYSICS LETTERS, 2005, 86 (26) :1-3
[7]   Evaluating luminescence based voltage images of silicon solar cells [J].
Glatthaar, M. ;
Haunschild, J. ;
Zeidler, R. ;
Demant, M. ;
Greulich, J. ;
Michl, B. ;
Warta, W. ;
Rein, S. ;
Preu, R. .
JOURNAL OF APPLIED PHYSICS, 2010, 108 (01)
[8]   Imaging the local ideality factor by contactless photoluminescence measurement [J].
Hameiri, Ziv ;
Chaturvedi, Pooja ;
McIntosh, Keith R. .
APPLIED PHYSICS LETTERS, 2013, 103 (02)
[9]   Advanced luminescence based effective series resistance imaging of silicon solar cells [J].
Kampwerth, H. ;
Trupke, T. ;
Weber, J. W. ;
Augarten, Y. .
APPLIED PHYSICS LETTERS, 2008, 93 (20)
[10]   Luminescence imaging for the detection of shunts on silicon solar cells [J].
Kasemann, M. ;
Grote, D. ;
Walter, B. ;
Kwapil, W. ;
Trupke, T. ;
Augarten, Y. ;
Bardos, R. A. ;
Pink, E. ;
Abbott, M. D. ;
Warta, W. .
PROGRESS IN PHOTOVOLTAICS, 2008, 16 (04) :297-305
12