Local mechanical properties determined by atomic force microscopy.

被引：2

作者：

Finot, E ^{[1
]}

机构：

[1] Univ Bourgogne, Phys Lab, CNRS, UMR 5027, F-21011 Dijon, France

来源：

ANNALES DE CHIMIE-SCIENCE DES MATERIAUX | 2004年 / 29卷 / 03期

关键词：

D O I：

10.3166/acsm.29.3.33-45

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Over the past 15 years, advances in the field of atomic force microscopy (AFM) have broadened its use from a high-resolution imaging instrument to a device capable of measuring surface forces in near-native conditions. This article reviews developments made in our lab for quantitatively characterizing the surface reactivity and the mechanical properties of the surface. The derived applications that use the microcantilever as a sensor for measuring the Young's modulus as well as the surface stress are also presented. Those developments make the AFM a powerful tool to investigate the passivation and corrosion processes.

引用

页码：33 / 45

页数：13

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