An analytical simulation model for VCSELs to support signal integrity analysis of optical interconnects

被引:0
|
作者
Clarici, Georg [1 ]
Griese, Elmar [1 ]
机构
[1] Univ Siegen, Inst Theoret Elect Engn & Photon, Hoelderlinstr 3, D-57068 Siegen, Germany
关键词
optical interconnects; signal integrity; VCSEL; IBIS;
D O I
10.1117/12.661940
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The design of hybrid electro-optical systems needs to address the issue of signal integrity. In the area of electrical interconnects the input/output buffer information specification was introduced. To define a similar specification for optical interconnects an analytical model for vertical cavity surface emitting lasers is developed. It is based on the known solution of the Lotka-Volterra differential equations, which are related to the rate equations describing the behavior of lasers. The parameters of this analytical model directly describe the dynamic behavior of vertical cavity surface emitting lasers and they share many features with the input/output buffer information specification as they can be provided in a tabulated form and are partly accessible to measurement.
引用
收藏
页数:11
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