Simultaneous stimulated Raman gain and loss detection (SRGAL)

被引：12

作者：

Heuke, Sandro ^{[1
]}

Lombardini, Alberto ^{[1
,4
]}

Buttner, Edlef ^{[2
]}

Rigneault, Herve ^{[1
,3
]}

机构：

[1] Aix Marseille Univ, Turing Ctr Living Syst, Inst Fresnel, Cent Marseille,CNRS, Marseille, France

[2] APE Angew Phys & Elekt GmbH, Berlin, Germany

[3] Lightcore Technol, Marseille, France

[4] PSL Res Univ, Inst Biol Ecole Normale Super IBENS, Ecole Normale Super, CNRS,INSERM, F-75005 Paris, France

来源：

OPTICS EXPRESS | 2020年 / 28卷 / 20期

基金：

美国国家卫生研究院;

关键词：

SENSITIVITY;

D O I：

10.1364/OE.400298

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The fidelity of stimulated Raman scattering (SRS) microscopy images is impaired by artifacts such as thermal lensing, cross-phase modulation and multi-photon absorption. These artifacts affect differently the stimulated Raman loss (SRL) and stimulated Raman gain (SRG) channels making SRL and SRG image comparisons attractive to identify and correct SRS image artifacts. To provide answer to the question: "Can I trust my SRS images?", we designed a novel, but straightforward SRS scheme that enables the dectection of the stimulated Raman gain and loss (SRGAL) simultaneously at the same pixel level. As an advantage over the conventional SRS imaging scheme, SRGAL doubles the SRS signal by acquiring both SRL as well as SRG and allows for the identification of SRS artifacts and their reduction via a balanced summation of the SRL and SRG images. (C) 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

引用

页码：29619 / 29630

页数：12

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