A physically based parameter extraction scheme for SCR models
被引:0
作者:
Gohler, L
论文数: 0引用数: 0
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Gohler, L
Langer, T
论文数: 0引用数: 0
h-index: 0
Langer, T
Sigg, J
论文数: 0引用数: 0
h-index: 0
Sigg, J
机构:
来源:
PESC'97: 28TH ANNUAL IEEE POWER ELECTRONICS SPECIALISTS CONFERENCE - RECORD, VOLS I AND II
|
1997年
关键词:
D O I:
暂无
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
This paper presents a physically based parameter extraction scheme for SCR models. The methods are discussed and demonstrated with an example. The comparison between simulated and measured device behaviour shows agreement within 15% tolerance.