Numerical dark-field imaging using deep-learning

被引:9
作者
Meng, Zhang [1 ]
Ding, Liqi [1 ]
Feng, Shaotong [1 ]
Xing, FangJian [1 ]
Nie, Shouping [1 ]
Ma, Jun [2 ]
Pedrini, Giancarlo [3 ]
Yuan, Caojin [1 ]
机构
[1] Nanjing Normal Univ, Key Lab Optoelect Technol Jiangsu Prov, Nanjing 210023, Peoples R China
[2] Nanjing Univ Sci & Technol, Sch Elect Engn & Optoelect Tech, Nanjing 210094, Peoples R China
[3] Univ Stuttgart, Inst Tech Opt, Pfaffenwaldring 9, D-70569 Stuttgart, Germany
基金
中国国家自然科学基金;
关键词
DIGITAL HOLOGRAPHY; OPTICAL VORTEX; MICROSCOPY; ILLUMINATION; RECONSTRUCTION; TRANSFORMATION; CONTRAST; BRIGHT; BEAM;
D O I
10.1364/OE.401786
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Dark-field microscopy is a powerful technique for enhancing the imaging resolution and contrast of small unstained samples. In this study, we report a method based on end-to-end convolutional neural network to reconstruct high-resolution dark-field images from low-resolution bright-field images. The relation between bright- and dark-field which was difficult to deduce theoretically can be obtained by training the corresponding network. The training data, namely the matched bright- and dark-field images of the same object view, are simultaneously obtained by a special designed multiplexed image system. Since the image registration work which is the key step in data preparation is not needed, the manual error can be largely avoided. After training, a high-resolution numerical dark-field image is generated from a conventional bright-field image as the input of this network. We validated the method by the resolution test target and quantitative analysis of the reconstructed numerical dark-field images of biological tissues. The experimental results show that the proposed learning-based method can realize the conversion from bright-field image to dark-field image, so that can efficiently achieve high-resolution numerical dark-field imaging. The proposed network is universal for different kinds of samples. In addition, we also verify that the proposed method has good anti-noise performance and is not affected by the unstable factors caused by experiment setup. (C) 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
引用
收藏
页码:34266 / 34278
页数:13
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