Chirp and linewidth enhancement factor of 1.55 μm VCSEL with buried tunnel junction

被引：17

作者：

Halbritter, H

Shau, R

Riemenschneider, F

Kögel, B

Ortsiefer, M

Rosskopf, J

Böhm, G

Maute, M

Amann, MC

Meissner, P

机构：

[1] Tech Univ Darmstadt, Inst Hochfrequenztech, D-64283 Darmstadt, Germany

[2] VERTILAS GmbH, D-85748 Garching, Germany

[3] Tech Univ Munich, Walter Schottky Inst, D-85748 Garching, Germany

来源：

ELECTRONICS LETTERS | 2004年 / 40卷 / 20期

关键词：

D O I：

10.1049/el:20046457

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Chirp characteristics of a 1.55 mum vertical-cavity surface-emitting laser (VCSEL) employing a buried tunnel junction are reported for the first time. From the measurements the linewidth enhancement factor alpha(H) is derived and presented.

引用

页码：1266 / 1268

页数：3

共 6 条

[1] MEASUREMENT OF DIFFERENTIAL GAIN AND LINEWIDTH ENHANCEMENT FACTOR OF INGAAS VERTICAL-CAVITY SURFACE-EMITTING LASER [J].

DOWD, P ;

SUMMERS, HD ;

WHITE, IH ;

TAN, MRT ;

HOUNG, YM ;

WANG, SY .

ELECTRONICS LETTERS, 1995, 31 (07) :557-559

[2] MEASUREMENT OF THE LINEWIDTH ENHANCEMENT FACTOR-ALPHA OF SEMICONDUCTOR-LASERS [J].

HARDER, C ;

VAHALA, K ;

YARIV, A .

APPLIED PHYSICS LETTERS, 1983, 42 (04) :328-330

[3] Demonstration of methane spectroscopy using a vertical-cavity surface-emitting laser at 1.68 μm with up to 5 MHz repetition rate [J].

Lackner, M ;

Totschnig, G ;

Winter, F ;

Ortsiefer, M ;

Amann, MC ;

Shau, R ;

Rosskopf, J .

MEASUREMENT SCIENCE AND TECHNOLOGY, 2003, 14 (01) :101-106

[4] Linewidth of InP-based 1.55 μm VCSELs with buried tunnel junction [J].

Shau, R ;

Halbritter, H ;

Riemenschneider, E ;

Ortsiefer, M ;

Rosskopf, J ;

Böhm, G ;

Maute, M ;

Meissner, P ;

Amann, MC .

ELECTRONICS LETTERS, 2003, 39 (24) :1728-1729

[5] FREQUENCY-DOMAIN ANALYSIS OF AN OPTICAL FM DISCRIMINATOR [J].

SORIN, WV ;

CHANG, KW ;

CONRAD, GA ;

HERNDAY, PR .

JOURNAL OF LIGHTWAVE TECHNOLOGY, 1992, 10 (06) :787-793

[6] HIGH-SPEED MODULATION OF SEMICONDUCTOR-LASERS [J].

TUCKER, RS .

JOURNAL OF LIGHTWAVE TECHNOLOGY, 1985, 3 (06) :1180-1192

← 1 →