A facile deposition method for CuSCN: Exploring the influence of CuSCN on J-V hysteresis in planar perovskite solar cells

被引:51
作者
Sepalage, Gaveshana A. [1 ]
Meyer, Steffen [1 ]
Pascoe, Alexander R. [2 ]
Scully, Andrew D. [3 ]
Bach, Udo [2 ,3 ,4 ]
Cheng, Yi-Bing [2 ]
Spiccia, Leone [1 ]
机构
[1] Monash Univ, Sch Chem, Clayton, Vic 3800, Australia
[2] Monash Univ, Dept Mat Sci & Engn, Clayton, Vic 3800, Australia
[3] CSIRO Mfg, Bayview Ave, Clayton, Vic 3168, Australia
[4] Melbourne Ctr Nanofabricat, Tech Fellow, 151 Wellington Rd, Clayton, Vic 3168, Australia
关键词
Perovskite solar cells; Inorganic hole-conductors; Solution processing; Copper(I) thiocyanate; J-V hysteresis; P-TYPE SEMICONDUCTORS; LEAD IODIDE; HIGH-PERFORMANCE; ANOMALOUS HYSTERESIS; HOLE-CONDUCTOR; CH3NH3PBI3; FILMS; TRANSPORT; ORIGIN; RECOMBINATION;
D O I
10.1016/j.nanoen.2016.12.043
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Inorganic hole-transporting materials (HTMs) are a promising class of compounds for improving the long-term stability of perovskite solar cells. In this study, copper(I) thiocyanate ( CuSCN) has been applied as an HTM in planar-structured thin film perovskite solar cells based on methylammonium lead(II) triiodide. A common obstacle associated with the deposition of inorganic HTMs in perovskite-based solar cell devices is the damaging effect of polar solvents, required during the solution-processed deposition step, on the underlying perovskite film. Here we describe a novel fabrication method that allows the deposition of a CuCSN layer on perovskite film, achieving a maximum power conversion efficiency of 9.6%. The magnitude of J-V hysteresis is found to be strongly dependent on the HTM used, with the phenomenon being much more prevalent in the CuSCN- and spiro-OMeTAD-based devices compared to CuI-based devices. Interestingly, CuSCN and CuI showed significantly different J-V hysteresis behaviors despite their similar physicochemical properties. Further characterization by open circuit voltage decay (OCVD) measurements revealed that the relaxation of the perovskite polarization depends on the light intensity and the adjacent HTM layer. We propose that the stronger J-V hysteresis in CuSCN compared to CuI is a result of defects generated during the deposition process and possible degradation at the material interfaces while other possibilities are also discussed.
引用
收藏
页码:310 / 319
页数:10
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