Rietveld analysis of intensity data taken on the TOF neutron powder diffractometer VEGA

被引：134

作者：

Ohta, T ^{[1
]}

Izumi, F ^{[1
]}

Oikawa, K ^{[1
]}

Kamiyama, T ^{[1
]}

机构：

[1] UNIV TSUKUBA,INST MAT SCI,TSUKUBA,IBARAKI 305,JAPAN

来源：

PHYSICA B | 1997年 / 234卷

关键词：

Rietveld refinement; powder diffraction; time of flight;

D O I：

10.1016/S0921-4526(97)00032-X

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

A Rietveld-refinement program, RIETAN-96T, has been developed for a time-of-flight neutron powder diffractometer, VEGA, installed at the KENS. A profile function optimized for VEGA and an original feature called partial profile relaxation were implemented in RIETAN-96T, giving excellent fits between observed and calculated patterns.

引用

页码：1093 / 1095

页数：3

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