Orbital ordered structure of a manganite thin film observed by K-edge resonant X-ray scattering

被引：0
作者：
Wakabayashi, Y. [1 ]
Bizen, D. [2 ]
Nakao, H. [2 ]
Murakami, Y. [2 ,3 ]
Nakamura, M. [4 ]
Ogimoto, Y. [5 ]
Miyano, K. [6 ]
Sawa, H. [1 ]
机构：
[1] KEK, Photon Factory, Tsukuba, Ibaraki 3050801, Japan
[2] Tohoku Univ, Dept Phys, Sendai, Miyagi 9808578, Japan
[3] JAERI, Synchrotron Radiat Res Ctr, Mikazuki, Hyogo 6795148, Japan
[4] Univ Tokyo, Dept Appl Phys, Tokyo 1138586, Japan
[5] Sharp Co Ltd, Dev Tech Res Lab, Nara 6328567, Japan
[6] Univ Tokyo, Res Ctr Adv Sci & Technol, Tokyo 1538904, Japan
来源：
SYNCHROTRON RADIATION INSTRUMENTATION, PTS 1 AND 2 | 2007年 / 879卷
关键词：
Mn oxide; orbital ordering; resonant x-ray scattering;
D O I：
10.1063/1.2436399
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The low-temperature orbital ordering structure of Nd0.5Sr0.5MnO3 thin film on SrTiO3 (011) substrate (NSMO/STO011) has been clarified by resonant x-ray scattering. This thin film is the first example of the manganite thin film that has sharp metal-insulator transition, and synchrotron x-ray diffraction reveals the structure of the low-temperature orbital ordered phase. The orbital order structure was found to be the same as the structure of bulk Nd0.5Sr0.5MnO3, while the tilt/rotation of the MnO6 octahedra were different.
引用
收藏
页码：1711 / +
页数：2
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