Aging characteristics of blue InGaN micro-light emitting diodes at an extremely high current density of 3.5kAcm-2

被引:35
作者
Tian, Pengfei [1 ,2 ]
Althumali, Ahmad [2 ]
Gu, Erdan [2 ]
Watson, Ian M. [2 ]
Dawson, Martin D. [2 ]
Liu, Ran [1 ]
机构
[1] Fudan Univ, Engn Res Ctr Adv Lighting Technol, Minist Educ, Inst Elect Light Sources, Shanghai 200433, Peoples R China
[2] Univ Strathclyde, Dept Phys, Inst Photon, Glasgow, Lanark, Scotland
基金
英国工程与自然科学研究理事会;
关键词
micro-light emitting diodes; aging; InGaN; high current density; defect; DEGRADATION MECHANISMS; LED ARRAYS; RELIABILITY;
D O I
10.1088/0268-1242/31/4/045005
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The aging characteristics of blue InGaN micro-light emitting diodes (micro-LEDs) with different sizes have been studied at an extremely high current density 3.5 kA cm(-2) for emerging micro-LED applications including visible light communication (VLC), micro-LED pumped organic lasers and optogenetics. The light output power of micro-LEDs first increases and then decreases due to the competition of Mg activation in p-GaN layer and defect generation in the active region. The smaller micro-LEDs show less light output power degradation compared with larger micro-LEDs, which is attributed to the lower junction temperature of smaller micro-LEDs. It is found that the high current density without additional junction temperature cannot induce significant micro-LED degradation at room temperature but the combination of the high current density and high junction temperature leads to strong degradation. Furthermore, the cluster LEDs, composed of a micro-LED array, have been developed with both high light output power and less light output degradation for micro-LED applications in solid state lighting and VLC.
引用
收藏
页数:7
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