The growth of high quality graphene layers by chemical vapor deposition (CVD) has been found to strongly depend on growth conditions with results varying greatly from one laboratory to another for nominally identical conditions. We report the results of a systematic investigation of the role of hydrogen and oxidizing impurities present in the gas feedstock during the growth and cooling stages in low-pressure CVD. First, we show that for a partial pressure of oxidizing impurities below 1 ppb, hydrogen is not required for graphene growth from methane. Second, we demonstrate that purified hydrogen does not etch graphene films at typical growth temperatures. Third, a flow of purified hydrogen during cooling counterbalances graphene etching by oxygen, thus protecting the films. Films grown under high purity conditions (low level of oxidizing impurities) exhibit a higher bilayer and multilayer coverage; Surprisingly some of these bi- and multilayer graphene islands are twisted with respect to the first graphene layer as revealed by hyperspectral Raman imaging. Overall, this growth behavior suggests a competitive action between film growth from the carbon precursors and etching by the oxidative species. Our results provide new fundamental insights on the graphene CVD growth, highlighting the important yet indirect role of hydrogen and its major influence on controlling the action of oxidizing impurities on nucleation and etching during the growth process.
机构:
Univ Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Mat Metrol, BR-25250020 Duque De Caxias, RJ, BrazilUniv Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil
Carozo, Victor
;
Almeida, Clara M.
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Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Mat Metrol, BR-25250020 Duque De Caxias, RJ, BrazilUniv Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil
Almeida, Clara M.
;
Ferreira, Erlon H. M.
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Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Mat Metrol, BR-25250020 Duque De Caxias, RJ, BrazilUniv Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil
Ferreira, Erlon H. M.
;
Cancado, Luiz Gustavo
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机构:
Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, BrazilUniv Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil
Cancado, Luiz Gustavo
;
Achete, Carlos Alberto
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h-index: 0
机构:
Univ Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Mat Metrol, BR-25250020 Duque De Caxias, RJ, BrazilUniv Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil
Achete, Carlos Alberto
;
Jorio, Ado
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h-index: 0
机构:
Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, BrazilUniv Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil
机构:
City Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R ChinaCity Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R China
Chu, PK
;
Li, LH
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机构:
City Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R ChinaCity Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R China
机构:
Univ Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Mat Metrol, BR-25250020 Duque De Caxias, RJ, BrazilUniv Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil
Carozo, Victor
;
Almeida, Clara M.
论文数: 0引用数: 0
h-index: 0
机构:
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Mat Metrol, BR-25250020 Duque De Caxias, RJ, BrazilUniv Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil
Almeida, Clara M.
;
Ferreira, Erlon H. M.
论文数: 0引用数: 0
h-index: 0
机构:
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Mat Metrol, BR-25250020 Duque De Caxias, RJ, BrazilUniv Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil
Ferreira, Erlon H. M.
;
Cancado, Luiz Gustavo
论文数: 0引用数: 0
h-index: 0
机构:
Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, BrazilUniv Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil
Cancado, Luiz Gustavo
;
Achete, Carlos Alberto
论文数: 0引用数: 0
h-index: 0
机构:
Univ Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil
Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Mat Metrol, BR-25250020 Duque De Caxias, RJ, BrazilUniv Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil
Achete, Carlos Alberto
;
Jorio, Ado
论文数: 0引用数: 0
h-index: 0
机构:
Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, BrazilUniv Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil
机构:
City Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R ChinaCity Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R China
Chu, PK
;
Li, LH
论文数: 0引用数: 0
h-index: 0
机构:
City Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R ChinaCity Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R China