Arraying compact pixels of transition-edge microcalorimeters for imaging x-ray spectroscopy

被引:0
作者
Stahle, CK [1 ]
Lindeman, MA [1 ]
Figueroa-Feliciano, E [1 ]
Li, MJ [1 ]
Tralshawa, N [1 ]
Finkbeiner, FM [1 ]
Brekosky, RP [1 ]
Chervenak, JA [1 ]
机构
[1] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA
来源
LOW TEMPERATURE DETECTORS | 2002年 / 605卷
关键词
D O I
暂无
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
We are developing superconducting transition-edge sensor (TES) microcalorimeters for astronomical x-ray spectroscopy. We have obtained very high energy resolution (2.4 eV at 1.5 keV and 3.7 eV at 3.3 keV) in large, isolated TES pixels using Mo/Au proximity-effect bilayers on silicon-nitride membranes several mm wide. In order to be truly suitable for use behind an x-ray telescope, however, such devices need to be arrayed with a pixel size and focal-plane coverage matched to the telescope focal length and spatial resolution. For the Constellation-X mission, this requires fitting the TES, its thermal link, and contact wiring into a 0.25 mm square, a far more compact geometry than has previously been investigated. We have demonstrated that the weak thermal link can be restricted to a narrow (similar to10 micron) perimeter of membrane around the TES and still provide a thermal conductance in the acceptable range. Varying the size and placement of slits in that nitride perimeter, we can tune that value.
引用
收藏
页码:223 / 226
页数:4
相关论文
共 5 条
[1]   Properties of the phonon gas in ultrathin membranes at low temperature [J].
Anghel, DV ;
Pekola, JP ;
Leivo, MM ;
Suoknuuti, JK ;
Manninen, M .
PHYSICAL REVIEW LETTERS, 1998, 81 (14) :2958-2961
[2]   Measurements of thermal transport in low stress silicon nitride films [J].
Holmes, W ;
Gildemeister, JM ;
Richards, PL ;
Kotsubo, V .
APPLIED PHYSICS LETTERS, 1998, 72 (18) :2250-2252
[3]   Thermal-response time of superconducting transition-edge microcalorimeters [J].
Irwin, KD ;
Hilton, GC ;
Wollman, DA ;
Martinis, JM .
JOURNAL OF APPLIED PHYSICS, 1998, 83 (08) :3978-3985
[4]   Thermal characteristics of silicon nitride membranes at sub-Kelvin temperatures [J].
Leivo, MM ;
Pekola, JP .
APPLIED PHYSICS LETTERS, 1998, 72 (11) :1305-1307
[5]   Thermal conductance measurements of a silicon nitride membrane at low temperatures [J].
Woodcraft, AL ;
Sudiwala, RV ;
Wakui, E ;
Bhatia, RS ;
Bock, JJ ;
Turner, AD .
PHYSICA B, 2000, 284 :1968-1969