Measurement of linewidth enhancement factor of different semiconductor lasers in operating conditions

被引：10

作者：

Giuliani, Guido ^{[1
]}

Donati, Silvano ^{[1
]}

Elsaesser, Wolfgang ^{[2
]}

机构：

[1] Univ Pavia, Dipartimento Elettron, Via Ferrata 1, I-27100 Pavia, Italy

[2] Tech Univ Darmstadt, Inst Angewandte Phys, D-64289 Darmstadt, Germany

来源：

SEMICONDUCTOR LASERS AND LASER DYNAMICS II | 2006年 / 6184卷

关键词：

semiconductor laser; linewidth enhancement factor; laser linewidth; laser dynamics; optical feedback;

D O I：

10.1117/12.665178

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We apply the self-mixing method for the measurement of the linewidth enhancement factor of several types of semiconductor lasers. The a-factor value above threshold is determined by analysing the small perturbations that occur to the laser when it is subjected to moderate optical feedback, relying on the well-known Lang-Kobayashi equations. The method is applied to Fabry-Perot, VCSEL, External Cavity Laser (ECL), DFB, Quantum Cascade Laser. It is found that for some lasers the alpha-factor varies with the emitted power, and these variations can be correlated with variations in the laser linewidth.

引用

页数：9

共 16 条

[1] EFFECT OF GAIN NONLINEARITIES ON THE DYNAMIC-RESPONSE OF SINGLE-MODE SEMICONDUCTOR-LASERS [J].