Imaging of the DNA (deoxyribonucleic acid) double helix structure by noncontact atomic force microscopy

被引：23

作者：

Maeda, Y ^{[1
]}

Matsumoto, T ^{[1
]}

Tanaka, H ^{[1
]}

Kawai, T ^{[1
]}

机构：

[1] Osaka Univ, Inst Sci & Ind Res, Ibaraki, Osaka 5670047, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1999年 / 38卷 / 11A期

关键词：

DNA; double-helix; noncontact atomic force microscopy (NC-AFM); Cu(111); pulse injection;

D O I：

10.1143/JJAP.38.L1211

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Noncontact atomic force microscopy (NC-AFM) has been employed in order to observe double-stranded DNA (deoxyribonucleic acid) on a Cu(lll) surface. In-situ tip improvement was found to be effective for the NC-AFM measurement. The authors have obtained high-resolution images of double-stranded DNA including the DNA double helix structure using the shape-controlled tip.

引用

页码：L1211 / L1212

页数：2

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