Structural and dielectric properties of Bi2O3 doped polyaniline

被引：1
|
作者：
Shukla, R. K. [1 ]
Srivastava, Divyanshi [1 ]
机构：
[1] Univ Lucknow, Dept Phys, Lucknow 226007, Uttar Pradesh, India
来源：
MATERIALS TODAY-PROCEEDINGS | 2019年 / 15卷
关键词：
Conducting Polyaniline; XRD; FESEM; Bismuth; Dielectric properties;
D O I：
10.1016/j.matpr.2019.04.103
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Polyaniline (PAni) / Bi2O3 composite are synthesized by electrochemical polymerization method. The structural analysis is made by X-ray diffraction. The surface morphology of these composites has been studied with Field electron scanning electron microscope. The dielectric properties have been studied as function of frequency ranging from 100 Hz to 5 MHz at room temperature. The dielectric constant and dielectric loss tangent both decrease with increase in the frequency of the AC signal. Similar behaviour of dielectric constant and dielectric loss tangent is observed with increasing concentration of Bi2O3 in the composite, for a given frequency of AC signal. (C) 2019 Elsevier Ltd. All rights reserved.
引用
收藏
页码：424 / 428
页数：5
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