On Bit-depth of Pattern in Three-dimensional Measurement System Based on Digital Fringe Projection

被引:0
|
作者
Li Yong [1 ,2 ]
Chen Jinbiao [3 ]
Tu Yanshuai [1 ,2 ]
Wang Hui [1 ,2 ]
机构
[1] Zhejiang Prov Key Lab Opt Informat Detecting & Di, Jinhua 321004, Peoples R China
[2] Zhejiang Normal Univ, Inst Informat Opt, Jinhua 321004, Peoples R China
[3] Taizhou Univ, Coll Math & Informat Engn, Linhai 317000, Peoples R China
基金
中国国家自然科学基金;
关键词
Structured light illumination; high-speed optical three-dimensional imaging; uniform quantization algorithm; error diffusion; phase error;
D O I
10.1117/12.2266740
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Fringe pattern can be projected fast by digital projector using DLP technology. The projection speed is higher when patterns with lower bit-depth are adopted. The phase error of sinusoidal fringe pattern with different bit-depth is studied with three-step phase-shifting algorithm. The uniform quantization algorithm (UQA) and quantization algorithm with error diffusion (EDA) are used for pattern quantization. The conclusions are as following. 1) With UQA, the maximum of phase error will less than 1% of 2 Pi when bit-depth is higher than 4 bits. If the projector is defocused, the error will be decreased. 2) With EDA, the maximum of phase error is larger than that with UQA. But the error will be decreased significantly when the projector is defocused. The phase error of pattern with EDA is smaller than that of pattern with UQA when the projector is nearly focused and the period of pattern is long (for example longer than 20 pixels). If the period of pattern is short, the performance of UQA is always better. 3) The error difference of UQA and EDA will be very small when the bit-depth is higher than 4 bits.
引用
收藏
页数:5
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