Crystallographically Oriented Nanorods and Nanowires of RF-Magnetron-Sputtered Zinc Oxide

被引：6

作者：

Srivastava, A. K. ^{[1
]}

Chakraborty, B. R. ^{[1
]}

Chandra, S. ^{[2
]}

机构：

[1] Natl Phys Lab, New Delhi 110012, India

[2] Indian Inst Technol, New Delhi 110016, India

来源：

JOURNAL OF NANOMATERIALS | 2009年 / 2009卷

关键词：

GROWTH; FILMS; DEFECTS;

D O I：

10.1155/2009/310360

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The formation of nanoscaled one-dimensional structure constituting the thin films of ZnO via a RF magnetron sputtering process is demonstrated. A detailed analysis of these films has been carried out by exploiting the techniques of ellipsometry, scanning and transmission electron microscopy (SEM, TEM), high-resolution TEM, and scanning tunneling microscopy (STM). The importance of substrate materials due to the nanomorphologies as rods and wires on the substrates as amorphous quartz and silicon, respectively, has been elucidated. It has been exhibited that these fascinating nano-objects (rods, wires) are grown directionally along c-axis of hexagonal lattice of ZnO. The nucleation and growth mechanisms of these nano-objects have been discussed to interpret the present results. Copyright (C) 2009 A. K. Srivastava et al.

引用

页数：5

共 17 条

[1] Effect of sol strength on growth, faceting and orientation of sol-gel derived ZnO nanostructures [J].