Analysis of Discontinuities Created by a Multilayer Material in a Rectangular Waveguide Using Mode Matching Technique

被引：0

作者：

Elmajid, Hassan ^{[1
]}

Terhzaz, Jaouad ^{[2
]}

Ammor, Hassan ^{[1
]}

机构：

[1] Mohammed V Univ Agdal, Lab EMI, Elect & Commun, Rabat, Morocco

[2] Reg Ctr Trades Educ & Training CRMEF, Casablanca, Morocco

来源：

2014 INTERNATIONAL CONFERENCE ON MULTIMEDIA COMPUTING AND SYSTEMS (ICMCS) | 2014年

关键词：

Mode Matching Technique; S-parameters; multilayer Dielectric Material; Microwave; MICROGENETIC ALGORITHM; DESIGN;

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper presents a new method to analyze the discontinuity of a multilayer dielectric material. The multilayer material sample is loaded in an X-band rectangular waveguide and its two port S-parameters are simulated as a function of frequency using the software Ansoft HFSS. Also, by applying the mode matching technique, expressions for the S-parameters of the multilayer dielectric material as a function of complex permittivity of individual layers are developed. A single layer material formed by using materials such as Teflon, a number of two layer materials formed by combinations of plexiglass and Teflon and sample of three layer materials are also presented.

引用

页码：1479 / 1483

页数：5

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