Mechanical Behavior of Sn-3.0Ag-0.5Cu/Cu Solder Joints After Isothermal Aging

被引:9
作者
Van Luong Nguyen [1 ]
Chung, Chin-Sung [2 ]
Kim, Ho-Kyung [3 ]
机构
[1] Seoul Natl Univ Sci & Technol, Grad Sch NID Fus Technol, Seoul 139743, South Korea
[2] Flow Master Co, R&D Ctr, Seoul 150105, South Korea
[3] Seoul Natl Univ Sci & Technol, Dept Mech & Automot Engn, Seoul 139743, South Korea
关键词
Thermal aging; intermetallic compound (IMC); activation energy; stress concentration; tensile strength; LEAD-FREE SOLDER; INTERMETALLIC COMPOUNDS; CU SUBSTRATE; STRENGTH; GROWTH; MICROSTRUCTURE; FRACTURE;
D O I
10.1007/s11664-015-4170-1
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The tensile impact behavior of lead-free Sn-3Ag-0.5Cu/Cu solder joints aged at 413 K and 453 K for times ranging from 24 h to 1000 h has been investigated in this study. The activation energy for growth of the intermetallic compound (IMC) layer was estimated and compared with literature values. Additionally, the tensile strength of solder joints with IMC thickness of 17.6 mu m was found to be more sensitive to the strain rate as compared with solder joints with thinner IMC layers. Equations representing the relationships among the effective stress, strain rate, aging time, and aging temperature as well as IMC thickness were established using matrix laboratory (MATLAB) software. These equations show that the tensile strength decreases with increase in the IMC thickness to about 8 mu m, after which it becomes nearly constant when the IMC thickness is between approximately 8 mu m and 14 mu m, before decreasing significantly when the IMC thickness exceeds 14 mu m. The main reason for these characteristics was excessive increase in the IMC thickness of solder joints, causing a change in the stress concentration of the tensile load from the protruding region to the inside of the IMC layer at the same tested strain rate.
引用
收藏
页码:125 / 135
页数:11
相关论文
共 27 条
[1]   An investigation of effects of Sb on the intermetallic formation in Sn-3.5Ag-0.7Cu solder joints [J].
Chen, BL ;
Li, GY .
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2005, 28 (03) :534-541
[2]   Effect of microelements addition on the interfacial reaction between Sn-Ag-Cu solders and the Cu substrate [J].
Chuang, CM ;
Lin, KL .
JOURNAL OF ELECTRONIC MATERIALS, 2003, 32 (12) :1426-1431
[3]   Microstructure, kinetic analysis and hardness of Sn-Ag-Cu-1 wt% nano-ZrO2 composite solder on OSP-Cu pads [J].
Gain, Asit Kumar ;
Fouzder, Tama ;
Chan, Y. C. ;
Yung, Winco K. C. .
JOURNAL OF ALLOYS AND COMPOUNDS, 2011, 509 (07) :3319-3325
[4]   Effects of aging treatment on mechanical properties and microstructure of Sn-8.5Zn-0.5Ag-0.01Al-0.1Ga Solder [J].
Hsuan, Teng-Chun ;
Lin, Kwang-Lung .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2007, 456 (1-2) :202-209
[5]   Shear deformation behavior of a Sn-3Ag-0.5Cu single solder ball at intermediate strain rates [J].
Joo, Se-Min ;
Kim, Ho-Kyung .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2011, 528 (06) :2711-2717
[6]   Influence of interfacial intermetallic compound on fracture behavior of solder joints [J].
Lee, HT ;
Chen, MH ;
Jao, HM ;
Liao, TL .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2003, 358 (1-2) :134-141
[7]   Influence of intermetallic compounds on the adhesive strength of solder joints [J].
Lee, HT ;
Chen, MH .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2002, 333 (1-2) :24-34
[8]   Effect of Isothermal Aging and Thermal Cycling on Interfacial IMC Growth and Fracture Behavior of SnAgCu/Cu Joints [J].
Li, Xiaoyan ;
Li, Fenghui ;
Guo, Fu ;
Shi, Yaowu .
JOURNAL OF ELECTRONIC MATERIALS, 2011, 40 (01) :51-61
[9]   Evolution of Intermetallic Compounds between Sn-0.3Ag-0.7Cu Low-silver Lead-free Solder and Cu Substrate during Thermal Aging [J].
Mookam, Niwat ;
Kanlayasiri, Kannachai .
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, 2012, 28 (01) :53-59
[10]  
Norton R. L., 2002, MACHINE DESIGN INTEG, P286