共 22 条
- [1] [Anonymous], 2005, GEIASTD00052
- [2] [Anonymous], 2008, ANSIGEIASTD0006
- [3] Bailey C, 2013, EL PACKAG TECH CONF, P156, DOI 10.1109/EPTC.2013.6745704
- [4] Brown M. E., 2006, INTRO THERMAL ANAL T
- [5] Effect of simulation methodology on solder joint crack growth correlation [J]. 50TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE - 2000 PROCEEDINGS, 2000, : 1048 - 1058
- [6] Darveaux R., 1995, CHAP 13, P379
- [7] Failure Mechanisms and Models for Semiconductor Devices, 2006, JEP122C JEDEC
- [8] Assessment of Solder-Dipping as a Tin Whisker Mitigation Strategy [J]. IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2011, 1 (06): : 957 - 963
- [9] Meschter S., 2008, P ASME INT MECH ENG, P183
- [10] Tin whiskering risk factors [J]. IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2004, 27 (02): : 427 - 431