Measurement of third-order nonlinear susceptibility tensor in InP using extended Z-scan technique with elliptical polarization

被引：2

作者：

Oishi, Masaki ^{[1
]}

Shinozaki, Tomohisa ^{[1
]}

Hara, Hikaru ^{[1
]}

Yamamoto, Kazunuki ^{[1
]}

Matsusue, Toshio ^{[1
]}

Bando, Hiroyuki ^{[1
]}

机构：

[1] Chiba Univ, Grad Sch Adv Integrat Sci, Dept Nanomat Sci, Chiba 2638522, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 2018年 / 57卷 / 05期

关键词：

2-PHOTON ABSORPTION-SPECTRA; ZINCBLENDE SEMICONDUCTORS; SINGLE-BEAM; UNDOPED INP; ANISOTROPY; REFRACTION; COEFFICIENTS;

D O I：

10.7567/JJAP.57.050306

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The elliptical polarization dependence of the two-photon absorption coefficient beta in InP has been measured by the extended Z-scan technique for thick materials in the wavelength range from 1640 to 1800 nm. The analytical formula of the Z-scan technique has been extended with consideration of multiple reflections. The Z-scan results have been fitted very well by the formula and beta has been evaluated accurately. The three independent elements of the third-order nonlinear susceptibility tensor in InP have also been determined accurately from the elliptical polarization dependence of beta. (C) 2018 The Japan Society of Applied Physics

引用

页数：4

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