Combined double sampling and variable sampling interval (X)over-bar chart

被引:53
作者
Carot, V [1 ]
Jabaloyes, JM [1 ]
Carot, T [1 ]
机构
[1] Univ Politecn Valencia, Dept Stat, E-46020 Valencia, Spain
关键词
D O I
10.1080/00207540210128260
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In recent years several studies have shown that the (X) over bar chart with variable sampling intervals (VSI), the (X) over bar chart with variable size (VSS), the (X) over bar chart with variable sample size and sampling intervals (VSSI) and the (X) over bar chart with variable parameters (VP) detect both small and moderate shifts in the process mean more quickly than the traditional Shewhart (X) over bar chart. Double sampling is the counterpart to double sampling plans. A combined double sampling variable sampling interval (DSVSI) (X) over bar chart is studied in this paper. It is compared with the aforementioned charts and with the CUSUM and EWMA charts. In all cases, the DSVSI (X) over bar chart is quicker at detecting small and moderate shifts in the process mean. An example is provided.
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收藏
页码:2175 / 2186
页数:12
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