Characteristics of charge and discharge of PMMA samples due to electron irradiation

被引:9
|
作者
Feng Guo-Bao [1 ]
Wang Fang [1 ]
Hu Tian-Cun [2 ]
Cao Meng [1 ]
机构
[1] Xi An Jiao Tong Univ, Dept Elect Sci & Technol, Minist Educ, Key Lab Phys Elect & Devices, Xian 710049, Peoples R China
[2] Natl Key Lab Sci & Technol Space Microwave, Xian 710000, Peoples R China
基金
中国国家自然科学基金;
关键词
charge and discharge; PMMA; numerical simulation; electron irradiation; INSULATING THIN-FILM; BEAM IRRADIATION; SIMULATION; TRANSPORT; EMISSION; BEHAVIOR; MODEL;
D O I
10.1088/1674-1056/24/11/117901
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
In this study, using a comprehensive numerical simulation of charge and discharge processes, we investigate the formation and evolution of negative charge and discharge characteristics of a grounded PMMA film irradiated by a non-focused electron beam. Electron scattering and transport processes in the sample are simulated with the Monte Carlo and the finite-different time-domain (FDTD) methods, respectively. The properties of charge and discharge processes are presented by the evolution of internal currents, charge quantity, surface potential, and discharge time. Internal charge accumulation in the sample may reach saturation by primary electron (PE) irradiation providing the charge duration is enough. Internal free electrons will run off to the ground in the form of leakage current due to charge diffusion and drift during the discharge process after irradiation, while trapped electrons remain. The negative surface potential determined by the charging quantity decreases to its saturation in the charge process, and then increases in the discharge process. A larger thickness of the PMMA film will result in greater charge amount and surface potential in charge saturation and in final discharge state, while the electron mobility of the material has little effects on the final discharge state. Moreover, discharge time is less for smaller thickness or larger electron mobility. The presented results can be helpful for estimating and weakening the charging of insulating samples especially under the intermittent electron beam irradiation in related surface analysis or measurement.
引用
收藏
页数:7
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