Analysis of Fe-Si layered structures by reflected electron energy loss spectroscopy and inelastic scattering cross-section

被引：0

作者：

Parshin, A. S. ^{[1
]}

Aleksandrova, G. A. ^{[1
]}

Varnakov, S. N. ^{[1
,2
]}

Ovchinnikov, S. G. ^{[2
]}

机构：

[1] MF Reshetnev Siberian State Aerosp Univ, Krasnoyarsk, Russia

[2] Russian Acad Sci, LV Kirenskii Inst Phys, Siberian Div, Krasnoyarsk, Russia

来源：

JOURNAL OF STRUCTURAL CHEMISTRY | 2009年 / 50卷 / 03期

基金：

俄罗斯基础研究基金会;

关键词：

reflected electron energy loss spectroscopy; inelastic scattering cross-section; mean length of the inelastic free path of an electron;

D O I：

10.1007/s10947-009-0064-5

中图分类号：

O61 [无机化学];

学科分类号：

070301 ; 081704 ;

摘要：

This paper reports on our study of the formation of an interface of layered structures in the Fe-Si system by reflected electron energy loss spectroscopy (REELS). Quantitative element analysis was performed using the product of the mean length of the inelastic free path by the inelastic scattering cross-section of electrons. It is shown that the Fe-Si interface is quite uniform.

引用

页码：429 / 433

页数：5