TOF SIMS induced artificial topographical effects on the Y2(Al,Ga)5O12:Tb3+ thin films deposited on Si substrates by the pulsed laser deposition technique

被引：5
|
作者：
Yousif, A. [1 ,2 ]
Jafer, R. M. [1 ,2 ]
Terblans, J. J. [1 ]
Ntwaeaborwa, O. M. [1 ]
Duvenhage, M. M. [1 ]
Kumar, Vinod [1 ]
Swart, H. C. [1 ]
机构：
[1] Univ Free State, Dept Phys, ZA-9300 Bloemfontein, South Africa
[2] Univ Khartoum, Fac Educ, Dept Phys, Omdurman 11115, Sudan
来源：
APPLIED SURFACE SCIENCE | 2014年 / 313卷
基金：
新加坡国家研究基金会;
关键词：
Y-3(Al; Ga)(5)O-12:Tb; Agglomerated particles; TOF-SIMS; Topography; ABLATION;
D O I：
10.1016/j.apsusc.2014.06.016
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The presence of various types of particles on the surface of the pulsed laser deposited (PLD) thin films as well as the differences in the film structure, played an important role to induce artificial topographical effects on Y-3(Al,Ga)(5)O-12:Tb3+ PLD thin films deposited on Si substrates measured by time-of-flight secondary ion mass spectroscopy (TOF-SIMS). The two and three-dimensional (2D and 3D) images have been recorded in the positive ion mode. Analysis of the 3D images shows big agglomerated particles on the surface of the Si substrate that appears to be embedded in the substrate and the substrate appears to be on the same level as the particles. This phenomenon is due to the artificial topographic effects which are attributed to the experimental setup of the TOP-SIMS system. (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码：524 / 531
页数：8
相关论文
共 50 条
  • [41] Crystalline growth of cubic (Eu, Nd):Y2O3 thin films on α -Al2O3 by pulsed laser deposition
    P.B.W. Burmester
    G. Huber
    M. Kurfiss
    M. Schilling
    Applied Physics A, 2005, 80 : 627 - 630
  • [42] Crystalline growth of cubic (Eu, Nd):Y2O3 thin films on α-Al2O3 by pulsed laser deposition
    Burmester, PBW
    Huber, G
    Kurfiss, M
    Schilling, M
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2005, 80 (03): : 627 - 630
  • [43] Improved luminescence properties of pulsed laser deposited Eu:Y2O3 thin films on diamond coated silicon substrates
    Cho, KG
    Kumar, D
    Lee, DG
    Jones, SL
    Holloway, PH
    Singh, RK
    APPLIED PHYSICS LETTERS, 1997, 71 (23) : 3335 - 3337
  • [44] Thin Film Deposition of Tb3Al5O12:Ce by Pulsed Laser Ablation and Effects of Low-temperature Post-annealing
    Kim, Kang Min
    Chung, Jun Ho
    Ryu, Jeong Ho
    JOURNAL OF THE OPTICAL SOCIETY OF KOREA, 2012, 16 (01) : 76 - 79
  • [45] Comparison of Ta2O5 thin films deposited by "off-axis" and "on-axis" pulsed laser deposition technique
    Ninomiya, T
    Inoue, N
    Kashiwabara, S
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (5A): : 2756 - 2760
  • [46] C-V and DLTS studies of Al/Ta2O5/n-Si structures with Ta2O5 thin films deposited by pulsed laser deposition
    Zhang, SK
    Fu, ZW
    Ke, L
    Qin, QZ
    Lu, F
    Wang, X
    PROGRESS IN NATURAL SCIENCE, 1998, 8 (02) : 243 - 248
  • [47] C-V and DLTS studies of Al/Ta2O5/n-Si structures with Ta2O5 thin films deposited by pulsed laser deposition
    张胜坤
    付正文
    柯炼
    秦启宗
    陆方
    王迅
    Progress in Natural Science, 1998, (02) : 116 - 121
  • [48] Annealing effects on electrical properties and defects of CaCu3Ti4O12 thin films deposited by pulsed laser deposition
    Deng, Guochu
    Muralt, Paul
    PHYSICAL REVIEW B, 2010, 81 (22):
  • [49] The effect of oxygen pressure on the structural and photoluminescence properties of pulsed laser deposited (Y-Gd)3Al5O12:Ce3+ thin films
    P. C. Korir
    F. B. Dejene
    Journal of Materials Science: Materials in Electronics, 2019, 30 : 3257 - 3267
  • [50] The effect of oxygen pressure on the structural and photoluminescence properties of pulsed laser deposited (Y-Gd)3Al5O12:Ce3+ thin films
    Korir, P. C.
    Dejene, F. B.
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2019, 30 (04) : 3257 - 3267
12345