Surface analysis of polyethyleneterephthalate by ESCA and TOF-SIMS

PET (poly(ethylene-terephthalate)) samples provided by different suppliers were investigated with the surface-sensitive methods as electron spectroscopy for chemical analysis (ESCA) and time-of-flight secondary ion mass spectrometry (TOF-SIMS). Analysis by means of ESCA and time-of-flight secondary ion mass spectrometry (TOF-SIMS). Analysis by means of ESCA provides chemical information from a near-surface region of roughly 6 nm. Specific ESCA data no chemical shifts and on the ratio between oxygen and carbon are compared with the corresponding values expected for the molecular structure of bulk PET. In addition, direct chemical information on the molecular structure at the PET surface (essentially from the first two monolayers) has been obtained by TOF-SIMS. Especially, positive and negative TOF-SIMS mass spectra were analyzed in detail and assigned with respect to characteristic polymer fragment ions. Several polymer additives as well as some contaminations present at the PET surfaces could be identified with TOF-SIMS. Dependent on the PET supplier, antioxidants and lubricants such as Irgafos 168, octylstearate, octylpalmitate, octylarachidate and PDMS (polydimethylsiloxane) found at the sample surfaces give typical positive and negative ion fragments.