Neutron diffraction study of conducting polyaniline doped with (±) camphorsulfonic acid

被引:5
作者
Kozik, Tomasz [1 ]
Sniechowski, Maciej [1 ]
Luzny, Wojciech [1 ]
Pron, Adam [2 ]
Djurado, David [3 ]
机构
[1] AGH Univ Sci & Technol, Fac Phys & Appl Comp Sci, Al Adama Mickiewicza 30, PL-30059 Krakow, Poland
[2] Warsaw Univ Technol, Fac Chem, Noakowskiego 3, PL-00664 Warsaw, Poland
[3] Univ Grenoble Alpes, CNRS, CEA, CEA Grenoble,INAC SPrAM, 25 Rue Martyrs, F-38042 Grenoble, France
关键词
Polyaniline; Neutron diffraction; Simulations; COUNTERION-INDUCED PROCESSIBILITY; CAMPHOR SULFONIC-ACID; STRUCTURAL-PROPERTIES; POLYMER SYSTEM; SURFACE DIFFRACTION; THIN-FILMS; ORIENTATION; MORPHOLOGY; TRANSPORT; MODEL;
D O I
10.1016/j.polymer.2017.01.034
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Fully hydrogenated and partially deuterated free standing films of polyaniline doped with (+/-) camphorsulfonic acid (PANIh5/CSA and PANId4/CSA) are subjected to neutron diffraction study. Obtained results are analyzed and compared with X-ray diffraction measurements. The very distinct differences observed between the two neutron diffraction profiles are described in detail. Making use of the recently published new model of the crystalline structure of the PANI/CSA system, the neutron diffraction curves for the analogous structures are calculated. The two calculated neutron diffraction patterns exhibit similar differences as those obtained in experiment. This fully confirms the validity of the refined molecular model elaborated for this still important material for applications as synthetic metals or organic thermoelectrics. (C)2017 Elsevier Ltd. All rights reserved.
引用
收藏
页码:148 / 155
页数:8
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