Supervised distance metric learning through maximization of the Jeffrey divergence

被引:76
作者
Bac Nguyen [1 ]
Morell, Carlos [2 ]
De Baets, Bernard [1 ]
机构
[1] Univ Ghent, KERMIT, Dept Math Modelling Stat & Bioinformat, Coupure Links 653, B-9000 Ghent, Belgium
[2] Univ Cent Marta Abreu Las Villas, Dept Comp Sci, Santa Clara, CA, Cuba
关键词
Distance metric learning; Nearest neighbor; Linear transformation; Jeffrey divergence; COMPONENT ANALYSIS; CONSTRAINTS; KERNEL;
D O I
10.1016/j.patcog.2016.11.010
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Over the past decades, distance metric learning has attracted a lot of interest in machine learning and related fields. In this work, we propose an optimization framework for distance metric learning via linear transformations by maximizing the Jeffrey divergence between two multivariate Gaussian distributions derived from local pairwise constraints. In our method, the distance metric is trained on positive and negative difference spaces, which are built from the neighborhood of each training instance, so that the local discriminative information is preserved. We show how to solve this problem with a closed-form solution rather than using tedious optimization procedures. The solution is easy to implement, and tractable for large-scale problems. Experimental results are presented for both a linear and a kernelized version of the proposed method for k nearest neighbors classification. We obtain classification accuracies superior to the state-of-the-art distance metric learning methods in several cases while being competitive in others.
引用
收藏
页码:215 / 225
页数:11
相关论文
共 53 条
  • [1] KEEL: a software tool to assess evolutionary algorithms for data mining problems
    Alcala-Fdez, J.
    Sanchez, L.
    Garcia, S.
    del Jesus, M. J.
    Ventura, S.
    Garrell, J. M.
    Otero, J.
    Romero, C.
    Bacardit, J.
    Rivas, V. M.
    Fernandez, J. C.
    Herrera, F.
    [J]. SOFT COMPUTING, 2009, 13 (03) : 307 - 318
  • [2] [Anonymous], 2001, Learning with Kernels |
  • [3] [Anonymous], 2009, P ADV NEUR INF PROC
  • [4] [Anonymous], 2005, Adv Neural Inf Process Syst
  • [5] [Anonymous], 2006, 2006 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR'06), DOI DOI 10.1109/CVPR.2006.167
  • [6] [Anonymous], 2002, NIPS
  • [7] [Anonymous], 1990, Introduction to statistical pattern recognition
  • [8] Non-linear metric learning using pairwise similarity and dissimilarity constraints and the geometrical structure of data
    Baghshah, Mahdieh Soleymani
    Shouraki, Saeed Bagheri
    [J]. PATTERN RECOGNITION, 2010, 43 (08) : 2982 - 2992
  • [9] Bar-Hillel AB, 2005, J MACH LEARN RES, V6, P937
  • [10] Bellet A., 2015, SYNTH LECT ARTIF INT, V9, P1, DOI DOI 10.2200/S00626ED1V01Y201501AIM030