Effect of Jahn-Teller distortion on the short range magnetic order in copper ferrite

被引:45
作者
Abdellatif, M. H. [1 ]
Innocenti, Claudia [3 ]
Liakos, Ioannis [1 ]
Scarpellini, Alice [2 ]
Marras, Sergio [2 ]
Salerno, Marco [1 ]
机构
[1] Ist Italiano Tecnol, Nanostrctures Dept, Via Morego 30, I-16163 Genoa, Italy
[2] Ist Italiano Tecnol, Nanochem Dept, Via Morego 30, I-16163 Genoa, Italy
[3] Univ Florence, INSTM Dept Chem, Via Lastruccia 3, I-50019 Sesto Fiorentino, FI, Italy
关键词
Copper ferrite; Spinel; MFM; Magnetic domains; Nano-particles; NIO(001) SURFACE; CU-FERRITE; NANOPARTICLES; CUFE2O4; SPECTROSCOPY; PARTICLES; FIELD;
D O I
10.1016/j.jmmm.2016.10.110
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Copper ferrite of spinel crystal structure was synthesized in the form of nano-particles using citrate-gel auto-combustion method. The sample morphology and composition were identified using scanning electron microscopy, X-ray diffraction, and X-ray spectroscopy. The latter technique reveals an inverse spinel structure with Jahn-Teller tetragonal distortion. The static magnetization was measured using vibrating sample magnetometer. Magnetic force microscopy was used in combination with the magnetization data to demonstrate the finite size effect of the magnetic spins and their casting behavior due to the introduction of copper ions in the tetrahedral magnetic sub-lattices, which results in tetragonal distorting the spinel structure of the copper ferrite. The magnetic properties of materials are a result of the collective behavior of the magnetic spins, and magnetic force microscopy can probe the collective behavior of the magnetic spins in copper ferrite, yet providing a sufficient resolution to map the effects below the micrometer size scale, such as the magnetic spin canting. A theoretical study was done to clarify the finite size effect of Jahn-Teller distortion on the magnetic properties of the material. When the particles are in the nano-scale, below the single domain size, their magnetic properties are very sensitive to their size change.
引用
收藏
页码:402 / 409
页数:8
相关论文
共 38 条
[1]   Study on the properties of the copper substituted NiZn ferrites [J].
Ahmed, TT ;
Rahman, IZ ;
Rahman, MA .
JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, 2004, 153 :797-803
[2]   FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].
ALBRECHT, TR ;
GRUTTER, P ;
HORNE, D ;
RUGAR, D .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673
[3]   XPS STUDY OF SURFACE-COMPOSITION OF POLYCRYSTALLINE CUXCO3-XO4 (0 LESS-THAN-OR-EQUAL-TO X LESS-THAN 1) OBTAINED BY THERMAL-DECOMPOSITION OF NITRATE MIXTURES [J].
ANGELOV, S ;
TYULIEV, G ;
MARINOVA, T .
APPLIED SURFACE SCIENCE, 1987, 27 (04) :381-392
[4]   Processing, properties and some novel applications of magnetic nanoparticles [J].
Bahadur, D ;
Giri, J ;
Nayak, BB ;
Sriharsha, T ;
Pradhan, P ;
Prasad, NK ;
Barick, KC ;
Ambashta, RD .
PRAMANA-JOURNAL OF PHYSICS, 2005, 65 (04) :663-679
[5]   Cu-O network-dependent core-hole screening in low-dimensional cuprate systems: A high-resolution x-ray photoemission study [J].
Boske, T ;
Maiti, K ;
Knauff, O ;
Ruck, K ;
Golden, MS ;
Krabbes, G ;
Fink, J ;
Osafune, T ;
Motoyama, N ;
Eisaki, H ;
Uchida, S .
PHYSICAL REVIEW B, 1998, 57 (01) :138-141
[6]   Atomic-resolution STM of a system with strongly correlated electrons: NiO(001) surface structure and defect sites [J].
Castell, MR ;
Wincott, PL ;
Condon, NG ;
Muggelberg, C ;
Thornton, G ;
Dudarev, SL ;
Sutton, AP ;
Briggs, GAD .
PHYSICAL REVIEW B, 1997, 55 (12) :7859-7863
[7]   NONCOLLINEAR SPIN ARRANGEMENT IN ULTRAFINE FERRIMAGNETIC CRYSTALLITES [J].
COEY, JMD .
PHYSICAL REVIEW LETTERS, 1971, 27 (17) :1140-+
[8]   A simple model for the magnetocrystalline anisotropy in mixed ferrite nanoparticles [J].
de Biasi, R. S. ;
Cardoso, L. H. G. .
PHYSICA B-CONDENSED MATTER, 2012, 407 (18) :3893-3896
[9]   AN IMPROVED, 2-PARAMETER DISTRIBUTION METHOD FOR THE DESCRIPTION OF THE MOSSBAUER-SPECTRA OF MAGNETIC SMALL PARTICLES IN AN APPLIED FIELD [J].
DEBAKKER, PMA ;
DEGRAVE, E ;
PERSOONS, RM ;
BOWEN, LH ;
VANDENBERGHE, RE .
MEASUREMENT SCIENCE AND TECHNOLOGY, 1990, 1 (09) :954-964
[10]  
DOTSCH H, 1980, J APPL PHYS, V51, P3816, DOI 10.1063/1.328121