Dominance based analysis for large volume production fail diagnosis

被引：8
作者：
Seshadri, B. [1 ]
Pomeranz, I. [1 ]
Venkataraman, S. [2 ]
Amyeen, M. E. [2 ]
Reddy, S. M. [3 ]
机构：
[1] Purdue Univ, W Lafayette, IN 47907 USA
[2] Intel Corp, Hillsboro, OR 97124 USA
[3] Univ Iowa, Iowa City, IA 52242 USA
来源：
24TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS | 2006年
关键词：
D O I：
10.1109/VTS.2006.29
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
A procedure for using fault dominance in a large volume diagnosis environment is described. Fault dominance is shown to be useful for reducing the fault simulation time during diagnosis when used together with the concept of pattern dependence and maximally dominating faults. Results for both ISCAS benchmarks and industrial circuits are reported. The results show 9% to 44% average reduction in the fault simulation time for these circuits.
引用
收藏
页码：392 / +
页数：2
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