Pattern formation of a spatial epidemic model with standard incidence rate

被引：3
|
作者：
Fan, Y. [1 ]
机构：
[1] North Univ China, Sch Mechatron Engn, Taiyuan 030051, Peoples R China
来源：
INDIAN JOURNAL OF PHYSICS | 2014年 / 88卷 / 04期
关键词：
SI; Standard incidence rates; Pattern formation; Synchronization; POPULATION; SCATTERING; VACCINES; DISEASES; SKIN;
D O I：
10.1007/s12648-013-0431-0
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
In this paper, a spatial epidemic model with standard incidence rate is investigated. We obtain the Hopf and Turing bifurcation critical line. Moreover, it is verified that the model has rich dynamics by a series of numerical simulations. Both spotted and labyrinthine patterns are obtained. Furthermore, synchronization of the susceptibles and the infected is gained in the Turing domain. The obtained results show that standard incidence rate may have great influence on the spatial pattern of disease.
引用
收藏
页码：413 / 419
页数：7
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