Novel methodology for estimating the enhancement factor for tip-enhanced Raman spectroscopy

Enhancement factor and spatial resolution are two of the most important metrological parameters defining the quality of a tip-enhanced Raman spectrometer. A high degree of variability in the reported values of enhancement factor is highlighted in this work, and the possible reasons for the discrepancies are discussed. A methodology for estimating enhancement factor in tip-enhanced Raman imaging using a one-dimensional nanostructure such as single wall carbon nanotube is suggested. This methodology is verified using tip-enhanced Raman images from our laboratory, and an image from another group published previously. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3056155]