A delay metric for RC circuits based on the Weibull distribution

被引:35
作者
Liu, F [1 ]
Kashyap, C [1 ]
Alpert, CJ [1 ]
机构
[1] IBM Austin, Austin, TX 78758 USA
来源
IEEE/ACM INTERNATIONAL CONFERENCE ON CAD-02, DIGEST OF TECHNICAL PAPERS | 2002年
关键词
D O I
10.1109/ICCAD.2002.1167597
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Physical design optimizations such as placement, interconnect synthesis, floorplanning, and routing require fast and accurate analysis of RC networks. Because of its simple close form and fast evaluation, the Elmore delay metric has been widely adopted. The recently proposed delay metrics PRIMO and H-gamma match the first three circuit moments to the probability density function of a Gamma statistical distribution. Although these methods demonstrate impressive accuracy compared to other delay metrics, their implementations tend to be challenging. As an alternative to matching to the Gamma distribution, we propose to match the first two circuit moments to a Weibull distribution. The result is a new delay metric called Weibull based Delay (WED). The primary advantages of WED over PRIMO and H-gamma are its efficiency and ease of implementation. Experiments show that WED is robust and has satisfactory accuracies at both near-and far-end nodes.
引用
收藏
页码:620 / 624
页数:5
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