Moire in atomic force microscope

被引：27

作者：

Chen, H ^{[1
]}

Liu, D ^{[1
]}

Lee, A ^{[1
]}

机构：

[1] Michigan State Univ, Dept Mech & Mat Sci, E Lansing, MI 48824 USA

来源：

EXPERIMENTAL TECHNIQUES | 2000年 / 24卷 / 01期

关键词：

D O I：

10.1111/j.1747-1567.2000.tb01333.x

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

In this study, an Atomic Force Microscope (AFM) is used to perform microscopic measurements, besides the conventional use for microscopic observations. Overall, the measurements demonstrate the feasibility of forming moire fringes in AFM.

引用

页码：31 / 32

页数：2

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