Structure-dynamics relationship in crystallizing poly(ethylene terephthalate) as revealed by time-resolved X-ray and dielectric methods

被引:107
作者
Alvarez, C
Sics, I
Nogales, A
Denchev, Z
Funari, SS
Ezquerra, TA
机构
[1] CSIC, Inst Estructura Mat, E-28006 Madrid, Spain
[2] DESY, HASYLAB, Max Planck Inst Colloids & Surfaces, D-22603 Hamburg, Germany
关键词
crystallization; dielectric spectroscopy; synchrotron radiation;
D O I
10.1016/j.polymer.2003.09.069
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
The isothermal cold crystallization of poly(ethylene terephthalate) was investigated by simultaneous small and wide angle X-ray scattering (SAXS and WAXS) and dielectric spectroscopy (DS). By this experimental approach (SWD), simultaneously collected information was obtained about the specific changes occurring in both crystalline and amorphous phases during crystallization. The main features which are directly derived from our experiments can be explained assuming the formation of a heterogeneous multiple lamellar population arrangement. The rigid amorphous phase can be associated with the intra-lamellar stack amorphous phase. The restriction of the amorphous phase mobility mainly Occurs in the inter-lamellar stacks regions probably due to the formation of secondary lamellae. (C) 2004 Elsevier Ltd. All rights reserved.
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页码:3953 / 3959
页数:7
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