22FDX™ 5G 28GHz 20dBm Power Amplifier Constant Load and VSWR accelerated aging reliability

被引：0

作者：

Bossu, G. ^{[1
]}

Syed, S. ^{[2
]}

Evseev, S. ^{[1
]}

Jerome, J. A. S. ^{[2
]}

Arfaoui, W. ^{[1
]}

Lipp, D. ^{[1
]}

Siddabathula, M. ^{[1
]}

机构：

[1] GlobalFoundries Dresden, Dresden, Germany

[2] Globalfoundries US Inc, Santa Clara, CA USA

来源：

2022 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) | 2022年

关键词：

RF; reliability; mmWave; 5G; FDSOI; PA; CW; VSWR; Power Amplifier; testing;

D O I：

10.1109/IRPS48227.2022.9764418

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Power Amplifier (PA) is a key component for embedded RF/mmWave on advanced CMOS technologies on the way to replace the III/V technologies. PA reliability has been a long-standing blocker for those applications. In this paper, a novel methodology is introduced based on an automated waveform analysis tool. Simulation aging results are compared with experimental silicon validation stress for a 28GHz high gain RF Power Amplifier (PA) and confirmed. Waveform analysis tool enables a deeper understanding of both continuous waveform (CW) with constant load and ruggedness test, as well as a new perspective about RF/mmWave circuit aging.

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页数：5

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