Introduction to near-ambient pressure x-ray photoelectron spectroscopy characterization of various materials

被引：53

作者：

Patel, Dhananjay I. ^{[1
]}

Roychowdhury, Tuhin ^{[1
]}

Jain, Varun ^{[1
]}

Shah, Dhruv ^{[1
]}

Avval, Tahereh G. ^{[1
]}

Chatterjee, Shiladitya ^{[1
]}

Bahr, Stephan ^{[2
]}

Dietrich, Paul ^{[2
]}

Meyer, Michael ^{[2
]}

Thissen, Andreas ^{[2
]}

Linford, Matthew R. ^{[1
]}

机构：

[1] Brigham Young Univ, Dept Chem & Biochem, C100 BNSN, Provo, UT 84602 USA

[2] SPECS Surface Nano Anal GmbH, Voltastr 5, D-13355 Berlin, Germany

来源：

SURFACE SCIENCE SPECTRA | 2019年 / 26卷 / 01期

关键词：

near-ambient pressure x-ray photoelectron spectroscopy; NAP-XPS; x-ray photoelectron spectroscopy; XPS; EQUIVALENT WIDTH; TOOL; MERIT;

D O I：

10.1116/1.5109118

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Near-ambient pressure x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., greater than 2500 Pa. With NAP-XPS, a wide variety of unconventional materials can be analyzed, including moderately volatile liquids, biological samples, porous materials, and/or polymeric materials that outgas significantly. Charge compensation with NAP-XPS takes place simply through the residual/background gas in the chamber, which is ionized by the incident x-rays. High quality spectra-high resolution and good signal-to-noise ratios-are regularly obtained. This article is an introduction to a series of papers in Surface Science Spectra on the NAP-XPS characterization of a series of materials. The purpose of these articles is to introduce and demonstrate the versatility and usefulness of the technique. Published by the AVS.

引用

页数：3

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