共 18 条
- [1] Determination of Cu in CdTe/CdS devices before and after accelerated stress testing [J]. CONFERENCE RECORD OF THE TWENTY-EIGHTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2000, 2000, : 479 - 482
- [2] *ASTM, E103696 ASTM
- [3] Consistent processing and long term stability of CdTe devices [J]. Conference Record of the Thirty-First IEEE Photovoltaic Specialists Conference - 2005, 2005, : 323 - 326
- [4] Progress in Apollo® technology [J]. CONFERENCE RECORD OF THE TWENTY-NINTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE 2002, 2002, : 559 - 562
- [5] Evolution of CdS/CdTe device performance during Cu diffusion [J]. CONFERENCE RECORD OF THE THIRTY-FIRST IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2005, 2005, : 291 - 294
- [6] HAMMOND B, 2003, 3 NAT THIN FILM MOD
- [7] Electron-beam induced degradation in CdTe photovoltaics [J]. JOURNAL OF APPLIED PHYSICS, 2000, 88 (04) : 1794 - 1801
- [8] Transient degradation and recovery of CdS/CdTe solar cells [J]. CONFERENCE RECORD OF THE THIRTY-FIRST IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2005, 2005, : 319 - 322
- [10] Thin-film solar cells: Device measurements and analysis [J]. PROGRESS IN PHOTOVOLTAICS, 2004, 12 (2-3): : 155 - 176