Measurement of Seebeck Coefficient and Conductive Behaviors of Bi2Te3-xSex (x=0.15-0.6) Thermoelectric Semiconductors without Harmful Dopants

被引:12
作者
Fusa, Mei [1 ]
Yamamoto, Naoaki [2 ]
Hasezaki, Kazuhiro [3 ]
机构
[1] Shimane Univ, Interdisciplinary Grad Sch Sci & Engn, Matsue, Shimane 6908504, Japan
[2] Shimane Univ, Fac Mat Sci, Matsue, Shimane 6908504, Japan
[3] Univ Tokushima, Inst Sci & Technol, Dept Energy Syst, Tokushima 7708506, Japan
关键词
eco-materials; thermoelectrics; Seebeck coefficient; bismuth telluride selenide; n-type; SINGLE-CRYSTAL;
D O I
10.2320/matertrans.MB201301
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A system for measuring Seebeck coefficient was constructed and applied to Bi2Te3-xSex (x = 0.15-0.6) samples without harmful dopants, prepared by mechanical alloying (MA) followed by hot pressing (HP). The constructed thermal contact method system, using single and multiple AT values, gave Seebeck coefficients of a standard reference material (SRM 3451) at room temperature confirmable as 230 4 and 232 1 nV/K, respectively. X-ray diffraction patterns and differential scanning calorimetry curves showed that the MA HP-sintered samples of Bi2Te3,Sex were single-phase Bi2Te3-xSex-related materials. All the Bi2Te3-xSex samples were n-type semiconductors. The maximum power factor was 1.4 x 10(-3) W m(-1)K(-2) for Bi2Te3-xSex sintered at 623 K. These results indicated that doping with harmful materials of Bi2Te3-xSex Ser compounds prepared by the MA HP process is not necessary for carrier control.
引用
收藏
页码:942 / 946
页数:5
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