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Dielectrophoretic alignment of gallium nitride nanowires (GaN NWs) for use in device applications
被引:74
作者:

Kim, T. H.
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机构: Chonbuk Natl Univ, SPRC, Dept Semicond Sci & Technol, Jeonju 561756, South Korea

Lee, S. Y.
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机构: Chonbuk Natl Univ, SPRC, Dept Semicond Sci & Technol, Jeonju 561756, South Korea

Cho, N. K.
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机构: Chonbuk Natl Univ, SPRC, Dept Semicond Sci & Technol, Jeonju 561756, South Korea

Seong, H. K.
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机构: Chonbuk Natl Univ, SPRC, Dept Semicond Sci & Technol, Jeonju 561756, South Korea

Choi, H. J.
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机构: Chonbuk Natl Univ, SPRC, Dept Semicond Sci & Technol, Jeonju 561756, South Korea

Jung, S. W.
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机构: Chonbuk Natl Univ, SPRC, Dept Semicond Sci & Technol, Jeonju 561756, South Korea

Lee, S. K.
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机构:
Chonbuk Natl Univ, SPRC, Dept Semicond Sci & Technol, Jeonju 561756, South Korea Chonbuk Natl Univ, SPRC, Dept Semicond Sci & Technol, Jeonju 561756, South Korea
机构:
[1] Chonbuk Natl Univ, SPRC, Dept Semicond Sci & Technol, Jeonju 561756, South Korea
[2] KETI, Nano Mechatron Res Ctr, Songnam 463816, South Korea
[3] Yonsei Univ, Sch Adv Mat Sci & Engn, Seoul 120749, South Korea
关键词:
D O I:
10.1088/0957-4484/17/14/009
中图分类号:
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
We report on a simple and effective ac and dc dielectrophoresis (DEP) method that can be used to align and manipulate semiconductor gallium nitride (GaN) nanowires (NWs) with variations in the type of electrical fields as well as variations of frequency. We observed that the ability of the alignment and the formation of the assembling nanowires (single or a bundle configuration) strongly depend on the magnitude of both the ac and dc electric fields. The yield results indicate that the GaN NWs, using ac DEP, are better aligned with a higher yield rate of approximately 80% over the entire array in the chip than by using dc DEP. In addition, we first demonstrated the simple hybrid p-n junction structures assembled by n-type GaN nanowires together with a p-type silicon substrate (n-GaN NW/p-Si substrate) using dielectrophoresis. From the transport measurements, the p-n junction structures show well-defined current rectifying behaviour with a low reverse leakage current of approximately 3 x 10(-4) A at -25 V. We believe that our unique p-n junction structures can be useful for electronic and optoelectronic nanodevices such as rectifiers and UV nano-LEDs.
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页码:3394 / 3399
页数:6
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